Nano-View(韓國(guó))

NanoView

韓國(guó)Nano-Viewwww.nano-view.com韓國(guó)NanoView公司在橢偏儀領(lǐng)域不斷創(chuàng)新，擁有多項(xiàng)專利技術(shù)。多年來(lái)一直致力于高性能橢偏儀的研制與生產(chǎn)，其產(chǎn)品主要用于半導(dǎo)體、導(dǎo)體、介質(zhì)和液體薄膜的厚度、光學(xué)特性、成分比例和表面粗糙度等測(cè)量和分析，也可用于半導(dǎo)體器件和FPD顯示等領(lǐng)域。目前主要產(chǎn)品分光橢偏儀，以獨(dú)特的設(shè)計(jì)和無(wú)需校準(zhǔn)等多項(xiàng)先進(jìn)專利技術(shù)，使得測(cè)試時(shí)間大大減少的同時(shí)極大地增加了測(cè) 量精度。開發(fā)的多傳感頭的分光橢偏儀，用于半導(dǎo)體和顯示器生產(chǎn)線的在線Mapping分析。Nano-Viewisdevelopingandproducingthestateoftheartequipmentsthatcanmeasureandanalyzethethickness,opticalproperties,compositionratioandthesurfaceroughnessofthesemiconductor,conductor,dielectricandliquidthinfilmsthatareusedinsemiconductordevices,LCDdisplayandsolarcell.Ourcurrentmainproductsarethespectroscopicellipsometersthatcangreatlyreducethemeasurementtimeandincreasetheaccuracyasaresultofourpatented'calibrationandalignmentfree'method.Highspeedmeasurementisalsopossiblebyusingamultichanneldetector.Wealsoreducedthesizeoftheequipmentgreatlysothatthefootprintisminimal.Themeasurementandtheanalysiscanbevery